Effective Error Diagnosis for RTL Designs in HDLs

We propose an effective approach to diagnose multiple design errors in HDL designs with only one erroneous test case. Error candidates will be greatly reduced while ensuring that true erroneous statements are included in. The probability of correctness for each potential erroneous statement will be estimated such that the most suspected statements are reported first. Experiments show that the size of error candidates is indeed small and the estimation for the probability of correctness for potential error candidates is accurate.

• Type: Conference
• Year: 2002
• Where: ATS
• Authors: Tai-Ying Jiang, Chien-Nan Jimmy Liu, Jing-Yang Jou
• Keywords: ATS 2002, Erroneous Statement, Error Candidates, Hardware, True Erroneous Statements