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ITCC
2005
IEEE

Effective Steganalysis Based on Statistical Moments of Wavelet Characteristic Function

14 years 5 months ago
Effective Steganalysis Based on Statistical Moments of Wavelet Characteristic Function
Yun Q. Shi, Guorong Xuan, Chengyun Yang, Jianjiong
Added 25 Jun 2010
Updated 25 Jun 2010
Type Conference
Year 2005
Where ITCC
Authors Yun Q. Shi, Guorong Xuan, Chengyun Yang, Jianjiong Gao, Zhenping Zhang, Peiqi Chai, Dekun Zou, Chunhua Chen, Wen Chen
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