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37

VLSID
1995
IEEE

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An efficient automatic test generation system for path delay faults in combinational circuits

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An efficient automatic test generation system for path delay faults in combinational circuits

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Ananta K. Majhi, James Jacob, Lalit M. Patnaik, Vi

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VLSI | VLSID 1995 |

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Added	26 Aug 2010
Updated	26 Aug 2010
Type	Conference
Year	1995
Where	VLSID
Authors	Ananta K. Majhi, James Jacob, Lalit M. Patnaik, Vishwani D. Agrawal

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