External Plagiarism Detection Based on Standard IR Technology and Fast Recognition of Common Subsequences - Lab Report for PAN a

The plagiarism detection system described in this paper is aiming at bringing external plagiarism detection to the desktop. The main ideas are to incorporate standard IR technologies for the candidate selection and efficient data structures for the detailed analysis between a suspicious and a candidate document. Given that the system so far has only reached prototype status, the first results look promising.

• Type: Conference
• Year: 2010
• Where: CLEF
• Authors: Thomas Gottron
• Keywords: CLEF 2010, External Plagiarism Detection, Incorporate Standard Ir, Information Technology, Plagiarism Detection