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    CLEF
    2010
    Springer
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    External Plagiarism Detection Based on Standard IR Technology and Fast Recognition of Common Subsequences - Lab Report for PAN a
    14 years 18 days ago
    External Plagiarism Detection Based on Standard IR Technology and Fast Recognition of Common Subsequences - Lab Report for PAN a
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    The plagiarism detection system described in this paper is aiming at bringing external plagiarism detection to the desktop. The main ideas are to incorporate standard IR technologi...
    Thomas Gottron
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