Fault Diagnosis in Scan-Based BIST

A deterministic-partitioning technique and an improved analysis scheme for fault diagnosis in Scan-Based BIST is proposed. The incorporation of the superposition principle to the analysis phase of the diagnosis algorithm improves diagnosis times significantly; furthermore, the deterministic partitioning approach results in even further reductions in diagnosis times together with higher predictability.

• Type: Conference
• Year: 1997
• Where: ITC
• Authors: Janusz Rajski, Jerzy Tyszer
• Keywords: Algorithm Improves Diagnosis, Diagnosis Times, Fault Diagnosis, Hardware, ITC 1997