Finding the Worst Voltage Violation in Multi-Domain Clock Gated Power Network

This paper proposes an efficient method to find the worst case of voltage violation by multi-domain clock gating in an on-chip power network. We first present a voltage response in an arbitrary multi-domain clock gating pattern, using a superposition technique. Then, an integer linear programming (ILP) formulation is proposed to identify the worst-case gating pattern and the maximum variation area. The ILP based method is significantly faster than a conventional method based on enumeration. The experimental results are also compared with a case where peak voltage variation is induced, which shows the latter technique largely underestimated the overall variation effect.

• Type: Conference
• Year: 2008
• Where: DATE
• Authors: Wanping Zhang, Yi Zhu, Wenjian Yu, Ling Zhang, Rui Shi, He Peng, Zhi Zhu, Lew Chua-Eoan, Rajeev Murgai, Toshiyuki Shibuya, Nuriyoki Ito, Chung-Kuan Cheng
• Keywords: Clock Gating Pattern, DATE 2008, Gating Pattern, Hardware, Multi-domain Clock Gating