Frequency-Domain Compatibility in Digital Filter BIST

We examine frequency-domain issues in the design and selection of on-chip test generators for built-in self-test (BIST) of highperformance digital filters. Test-generator/circuit compatibility is identified as a significant factor in testing large filters. A faultinjection experiment is used to show that when an incompatible test generator is used, high fault coverage (over 99%) does not guarantee that all serious faults will be detected. The frequency-domain characteristics of some basic test generation schemes are examined, and guidelines for test generator selection are proposed. Analytical techniques for identifying frequency-related testability problems are discussed, and several test generation schemes are evaluated by fault simulating them against lowpass, bandpass, and highpass filters. A mixed test generation scheme is shown to reduce the number of untested faults by a factor of two to three over a standard linearfeedback shift-register (LFSR) based test scheme, at littl...

• Type: Conference
• Year: 1997
• Where: DAC
• Authors: Laurence Goodby, Alex Orailoglu
• Keywords: Computer Architecture, DAC 1997, On-chip Test Generators, Test Generation Scheme, Test Generator