DAC
1997
ACM
14 years 3 months ago
1997
ACM
We examine frequency-domain issues in the design and selection of on-chip test generators for built-in self-test (BIST) of highperformance digital filters. Test-generator/circuit...
DAC
2000
ACM
15 years 12 days ago
2000
ACM
The effect of crosstalk errors is most significant in highperformance circuits, mandating at-speed testing for crosstalk defects. This paper describes a self-test methodology that...