Functional constraints vs. test compression in scan-based delay testing

We present an approach to prevent overtesting in scan-based delay test. The test data is transformed with respect to functional constraints while simultaneously keeping as many positions as possible unspecified in order to facilitate test compression. The method is independent of the employed delay fault model, ATPG algorithm and test compression technique, and it is easy to integrate into an existing flow. Experimental results emphasize the severity of overtesting in scanbased delay test. Influence of different functional constraints on the amount of the required test data and the compression efficiency is investigated. To the best of our knowledge, this is the first systematic study on the relationship between overtesting prevention and test compression.

• Type: Conference
• Year: 2006
• Where: DATE
• Authors: Ilia Polian, Hideo Fujiwara
• Keywords: DATE 2006, Delay Test, Hardware, Test Compression, Test Data