GECOM: Test data compression combined with all unknown response masking

15 years 5 months ago

This paper introduces GECOM technology, a novel test compression method with seamless integration of test GE

Youhua Shi, Nozomu Togawa, Masao Yanagisawa, Tatsu

ASPDAC 2008 | GECOM Architecture | GECOM ATPG | GECOM Technology | Hardware |

claim paper

Added	12 Oct 2010
Updated	12 Oct 2010
Type	Conference
Year	2008
Where	ASPDAC
Authors	Youhua Shi, Nozomu Togawa, Masao Yanagisawa, Tatsuo Ohtsuki

Comments (0)