Generation of broadside transition fault test sets that detect four-way bridging faults

Generation of n -detection test sets is typically done for a single fault model. In this work we investigate the generation of n -detection test sets by pairing each fault of a target fault model with n faults of a different fault model. Tests are generated such that they detect both faults of a pair. To facilitate test generation, we ensure that the faults included in a single pair have overlapping requirements for their detection. The advantage of this approach is that it ensures the detection of additional faults that would not be targeted during n -detection test generation for a single fault model. Experimental results with transition faults as the first fault model and four-way bridging faults as the second fault model are presented.

• Type: Conference
• Year: 2006
• Where: DATE
• Authors: Irith Pomeranz, Sudhakar M. Reddy
• Keywords: DATE 2006, Fault Model, Faults, Hardware, Single Fault Model