Highly-Guided X-Filling Method for Effective Low-Capture-Power Scan Test Generation

—X-filling is preferred for low-capture-power scan test generation, since it reduces IR-drop-induced yield loss without the need of any circuit modification. However, the effectiveness of previous X-filling methods suffers from lack of guidance in selecting targets and values for X-filling. This paper addresses this problem with a highly-guided X-filling method based on two novel concepts: (1) X-score for X-filling target selection and (2) probabilistic weighted capture transition count for X-filling value selection. Experimental results show the superiority of the new X-filling method for capture power reduction.

• Type: Conference
• Year: 2006
• Where: ICCD
• Authors: Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Yuta Yamato, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja
• Keywords: Capture Power Reduction, Hardware, ICCD 2006, Probabilistic Weighted Capture, Scan Test Generation