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    ICRA
    2008
    IEEE
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    An ICP variant using a point-to-line metric

    14 years 5 months ago
    An ICP variant using a point-to-line metric
    Download  www.cds.caltech.edu
    Andrea Censi
    claim paper
    Added 30 May 2010
    Updated 30 May 2010
    Type Conference
    Year 2008
    Where ICRA
    Authors Andrea Censi
    Comments (0)
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