Improving the testability and reliability of sequential circuits with invariant logic

In this paper, we investigate dual applications for logic implications, which can provide both online error detection capabilities and improve the testing efficiency of an integrated circuit. These logic implications are implemented in hardware and help to verify that expected invariant circuit relationships are satisfied during field operation. Thus, any implication violation will indicate the presence of an error due to some faulty circuit behavior. In addition, checking these logic implications in hardware will create additional circuit outputs, which may be useful for compacting n-detect test sets. Our results show that logic implications can provide significant error detection and test pattern count reduction with very limited hardware overhead.

• Type: Conference
• Year: 2010
• Where: GLVLSI
• Authors: Nuno Alves, Kundan Nepal, Jennifer Dworak, R. Iris Bahar
• Keywords: Error Detection, Error Detection Capabilities, GLVLSI 2010, Logic Implications, VLSI