In a testing environment, where an IUT communicates with multiple entities, a tester may have di ering degrees of controllability on the interactions between these entities and the IUT: directly controllable, semicontrollable, or uncontrollable. In this paper, a graph conversion algorithm is introduced that o ers the testability of both the directly and semicontrollable inputs, while avoiding race conditions. Although, for the most general case, the graph conversion results in an exponentially large number of nodes, practical considerations make the converted graph size feasible. Currently, this methodology is being applied to generate tests for MIL-STD 188-220B, which increases the number of testable state transitions from approximately 200 to over 700. Dr. Uyar performed this research while a Visiting Associate Professor at University of Delaware.
Mariusz A. Fecko, M. Ümit Uyar, Adarshpal S.