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ITC
2003
IEEE

On-line Detection of Faults in Carry-Select Adders

14 years 5 months ago
On-line Detection of Faults in Carry-Select Adders
This paper proposes an architecture for implementing a self-checking 4-bit carry select adder that can be extended to any n-bit addition. The overhead is directly proportional to the number of transistors in the adder.
B. Kiran Kumar, Parag K. Lala
Added 04 Jul 2010
Updated 04 Jul 2010
Type Conference
Year 2003
Where ITC
Authors B. Kiran Kumar, Parag K. Lala
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