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25

ITC
2003
IEEE

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Low Contact-Force Fritting Probe Card Using Buckling Microcantilevers

14 years 5 months ago

Low Contact-Force Fritting Probe Card Using Buckling Microcantilevers

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Kenichi Kataoka, Toshihiro Itoh, Tadatomo Suga

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Added	04 Jul 2010
Updated	04 Jul 2010
Type	Conference
Year	2003
Where	ITC
Authors	Kenichi Kataoka, Toshihiro Itoh, Tadatomo Suga

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