Low-Cost On-Line Test for Digital Filters

A low-cost on-line test scheme for digital filters is proposed. The scheme uses an invariant of the digital filter, the frequency response at specific points, in order to detect possible malfunctioning of the circuit. The analysis performed indicates that 100% fault secureness is possible, if certain design constraints are followed.

• Type: Conference
• Year: 1999
• Where: VTS
• Authors: Ismet Bayraktaroglu, Alex Orailoglu
• Keywords: Digital Filter, Hardware, On-line Test Scheme, Possible Malfunctioning, VTS 1999