March Tests for Word-Oriented Memories

Most memory test algorithms are optimized tests for a particular memory technology and a particular set of fault models, under the assumption that the memory is bit-oriented; i.e., read and write operations affect only a single bit in the memory. Traditionally, word-oriented memories have been tested by repeated application of a test for bit-oriented memories whereby a different data background (which depends on the used intra-word fault model) is used during each iteration. This results in time inefficiencies and limited fault coverage. A new approach for testing word-oriented memories is presented, distinguishing between inter-word and intra-word faults and allowing for a systematic way of converting tests for bit-oriented memories to tests for word-oriented memories. The conversion consists of concatenating the bit-oriented test for inter-word faults with a test for intra-word faults. This approach results in more efficient tests with complete coverage of the targeted faults. Becau...

• Type: Conference
• Year: 1998
• Where: DATE
• Authors: A. J. van de Goor, Issam B. S. Tlili
• Keywords: Bit-oriented Memories, DATE 1998, Hardware, Intra-word Faults, Word-oriented Memories