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    New experimental findings on hot-carrier-induced degradation in lateral DMOS transistors

    14 years 11 days ago
    New experimental findings on hot-carrier-induced degradation in lateral DMOS transistors
    Download  sdtlab.incheon.ac.kr
    In Kyung Lee, Se Re Na Yun, Kyosun Kim, Chong-Gun
    claim paper
    Added 14 Dec 2010
    Updated 14 Dec 2010
    Type Journal
    Year 2006
    Where MR
    Authors In Kyung Lee, Se Re Na Yun, Kyosun Kim, Chong-Gun Yu, Jong-Tae Park
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