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Image Analysis
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CAIP 2003
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A New Sharpness Measure Based on Gaussian Lines and Edges
14 years 1 months ago
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Judith Dijk, Michael van Ginkel, Rutger J. van Ass
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Added
06 Jul 2010
Updated
06 Jul 2010
Type
Conference
Year
2003
Where
CAIP
Authors
Judith Dijk, Michael van Ginkel, Rutger J. van Asselt, Lucas J. van Vliet, Piet W. Verbeek
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Researcher Info
Image Analysis Study Group
Computer Vision