Noise Figure Measurement Using Mixed-Signal BIST

—A Built-In Self-Test (BIST) approach for functionality measurements, including noise figure (NF), linearity and frequency response of analog circuitry in mixedsignal systems, is presented. The BIST circuitry consists of a direct digital synthesizer (DDS) based test pattern generator (TPG) and a multiplier/accumulator based output response analyzer (ORA). The BIST approach has been implemented in hardware and used for actual NF measurements for comparison with measurements from external test equipment.

• Type: Conference
• Year: 2007
• Where: ISCAS
• Authors: Jie Qin, Charles E. Stroud, Foster F. Dai
• Keywords: Actual Nf Measurements, BIST Circuitry, ISCAS 2007, —a Built-in Self-test