A new temperature compensation technique for ringoscillator-based ADC is proposed in this paper. It employs a novel fixed-number-based algorithm and a CTAT current biasing technology to compensate the temperaturedependent variations of the output, thus eliminates the need of digital calibrations. Simulation results prove that, with the proposed technique, the resolution under the temperature range of 0 to 100℃ ℃ can reach a 2-mV quantization bin size with an input voltage span of 120mV, at the sampling frequency fs=100KHz.