Optimal High-Resolution Spectral Analyzer

This paper presents a new application field for the Goertzel algorithm. The test of mixed-signal circuits involves the generation and analysis of signals. A standard method for the signal analysis is the Fast Fourier Transform (FFT algorithms). Such complex algorithms are not suitable for BIST (Built-In Self-Test) or BOST (Built-Off Self-Test) solutions due to their high demand for resources. In this paper, the Goertzel algorithm will be presented as an alternative to FFT algorithms. A new optimized structure of the Goertzel algorithm and its implementation in an FPGA (Field Programmable Gate Array) is presented. A comparison within the scope of the production test of RF transceiver devices shows a considerable reduction of the test time (factor 6) and resources (factor 10) compared to a FFT software solution respectively hardware solution.

• Type: Conference
• Year: 2008
• Where: DATE
• Authors: A. Tchegho, Heinz Mattes, Sebastian Sattler
• Keywords: DATE 2008, FFT Algorithms, Goertzel Algorithm, Hardware, Such Complex Algorithms