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    JETC
    2008
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    Parametric yield management for 3D ICs: Models and strategies for improvement

    14 years 17 days ago
    Parametric yield management for 3D ICs: Models and strategies for improvement
    Download  ic.engin.brown.edu
    Cesare Ferri, Sherief Reda, R. Iris Bahar
    claim paper
    Added 13 Dec 2010
    Updated 13 Dec 2010
    Type Journal
    Year 2008
    Where JETC
    Authors Cesare Ferri, Sherief Reda, R. Iris Bahar
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