| Power constrained and defect-probability driven SoC test scheduling with test set partitioning Recent countries visiting this post |  |
 | 3 | United States |
 | 1 | India |
 | 1 | Japan |
| Power constrained and defect-probability driven SoC test scheduling with test set partitioning Recent countries visiting this post | |
| 3 | United States |
| 1 | India |
| 1 | Japan |