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ATS
2003
IEEE

A Processor-Based Built-In Self-Repair Design for Embedded Memories

14 years 2 months ago
A Processor-Based Built-In Self-Repair Design for Embedded Memories
We propose an embedded processor-based built-in self-repair (BISR) design for embedded memories. In the proposed design we reuse the embedded processor that can be found on almost every system-on-chip (SOC) product, in addition to many distinct features. By reusing the embedded processor, the controller and redundancy analysis circuit of a typical BISR design can be removed. Also, the test algorithm and redundancy analysis/allocation algorithm are easily programmable, greatly increasing the design flexibility. We also have developed a memory wrapper that allows at-speed testing of the memory cores. The area overhead of the proposed BISR scheme is low, since only the memory wrapper needs to be realized explicitly. Our experiments show that the BISR area overhead for a typical 8K
Chin-Lung Su, Rei-Fu Huang, Cheng-Wen Wu
Added 23 Aug 2010
Updated 23 Aug 2010
Type Conference
Year 2003
Where ATS
Authors Chin-Lung Su, Rei-Fu Huang, Cheng-Wen Wu
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