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ITC
1989
IEEE

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Prototype Testing Simplified by Scannable Buffers and Latches

15 years 6 months ago

Prototype Testing Simplified by Scannable Buffers and Latches

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Andy Halliday, Greg Young, Alfred L. Crouch

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Hardware | ITC 1989 |

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Added	11 Aug 2010
Updated	11 Aug 2010
Type	Conference
Year	1989
Where	ITC
Authors	Andy Halliday, Greg Young, Alfred L. Crouch

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