ITC 1989 | Sciweavers

30

ITC
1989
IEEE

82views Hardware» more ITC 1989»

CMOS IC Stuck-Open Fault Electrical Effects and Design Considerations

14 years 4 months ago

- The electrical effects of CMOS IC physical defects that caused stuck-openfaults are evaluated, including their voltage levels, quiescent power supply current (IDDQ), transient re...

Jerry M. Soden, R. Keith Treece, Michael R. Taylor...

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29

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ITC
1989
IEEE

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Flexible, High-Performance Pin Electronics Implementation

14 years 4 months ago

Download thesis.lib.ncu.edu.tw

Phillip N. King

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30

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ITC
1989
IEEE

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The Pseudo-Exhaustive Test of Sequential Circuits

14 years 4 months ago

Download www.date.uni-paderborn.de

: The concept of a pseudo-exhaustive test for sequential circuits is introduced in a similar way as it is used for combinational networks. Instead of test sets one has to apply pse...

Sybille Hellebrand, Hans-Joachim Wunderlich

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33

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ITC
1989
IEEE

39views Hardware» more ITC 1989»

Prototype Testing Simplified by Scannable Buffers and Latches

14 years 4 months ago