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ITC
2003
IEEE

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On Reducing Test Data Volume and Test Application Time for Multiple Scan Chain Designs

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On Reducing Test Data Volume and Test Application Time for Multiple Scan Chain Designs

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Huaxing Tang, Sudhakar M. Reddy, Irith Pomeranz

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Added	04 Jul 2010
Updated	04 Jul 2010
Type	Conference
Year	2003
Where	ITC
Authors	Huaxing Tang, Sudhakar M. Reddy, Irith Pomeranz

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