| Reducing Test Point Area for BIST through Greater Use of Functional Flip-Flops to Drive Control Points Recent academic inistitutions visiting this post, which is a subset of the total traffic |  |
| Data is not available yet. |
| Reducing Test Point Area for BIST through Greater Use of Functional Flip-Flops to Drive Control Points Recent academic inistitutions visiting this post, which is a subset of the total traffic | |
| Data is not available yet. |