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DDECS
2008
IEEE
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Reduction of Test Vectors Volume by Means of Gate-Level Reconfiguration

16 years 1 min ago
Reduction of Test Vectors Volume by Means of Gate-Level Reconfiguration
Lukás Starecek, Lukás Sekanina, Zden
Added 29 May 2010
Updated 29 May 2010
Type Conference
Year 2008
Where DDECS
Authors Lukás Starecek, Lukás Sekanina, Zdenek Kotásek
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