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24

DDECS
2008
IEEE

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Reduction of Test Vectors Volume by Means of Gate-Level Reconfiguration

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Reduction of Test Vectors Volume by Means of Gate-Level Reconfiguration

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Lukás Starecek, Lukás Sekanina, Zden

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DDECS 2008 | Hardware |

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Added	29 May 2010
Updated	29 May 2010
Type	Conference
Year	2008
Where	DDECS
Authors	Lukás Starecek, Lukás Sekanina, Zdenek Kotásek

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