On the Reliability Evaluation of SRAM-Based FPGA Designs

Benefits of Field Programmable Gate Arrays (FPGAs) have lead to a spectrum of use ranging from consumer products to astronautics. This diversity necessitates the need to evaluate the reliability of the FPGA, because of their high susceptibility to soft errors, which are due to the high density of embedded SRAM cells. Reliability evaluation is an important step in designing highly reliable systems, which results in a strong competitive advantage in today's marketplace. This paper proposes a mathematical model able to evaluate and therefore help to improve the reliability of SRAM-based FPGAs.

• Type: Conference
• Year: 2005
• Where: FPL
• Authors: Olivier Héron, Talal Arnaout, Hans-Joachim Wunderlich
• Keywords: FPL 2005, Programmable Gate Arrays, Reliability Evaluation, Strong Competitive Advantage