Simultaneous Bidirectional Test Data Flow for a Low-cost Wafer Test Strategy

A two-wire test strategy with simultaneous bidirectional data flow and an independent clock line enables very high site count low-cost wafer probing.

• Type: Conference
• Year: 2003
• Where: ITC
• Authors: Burnell G. West
• Keywords: Count Low-cost Wafer, Hardware, ITC 2003, Simultaneous Bidirectional Data, Two-wire Test Strategy