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NBTI has been a major aging mechanism for advanced CMOS technology and PBTI is also looming as a big concern. This work first proposes a compact on-chip sensor design that tracks both NBTI and PBTI for both logic and SRAM circuits. Embedded in an SRAM array the sensor takes the form of a 6T SRAM cell and is at least 30
Zhenyu Qi, Jiajing Wang, Adam C. Cabe, Stuart N. W