Sciweavers

ASPDAC
2006
ACM

Statistical corner conditions of interconnect delay (corner LPE specifications)

14 years 5 months ago
Statistical corner conditions of interconnect delay (corner LPE specifications)
- Timing closure in LSI design becomes more and more difficult. But the conventional interconnect RC extraction method have over-margins caused by its corner conditions settings. In this paper, statistical corner conditions using the independence of variations between process parameters and between interconnect layers are proposed. As a result, the fast-to-slow guardband decreases by half in average, compared to the conventional method. The proposed method is ready for implementation to LPE tools.
Kenta Yamada, Noriaki Oda
Added 13 Jun 2010
Updated 13 Jun 2010
Type Conference
Year 2006
Where ASPDAC
Authors Kenta Yamada, Noriaki Oda
Comments (0)