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21

DAC
2003
ACM

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Statistical timing for parametric yield prediction of digital integrated circuits

15 years 12 days ago

Statistical timing for parametric yield prediction of digital integrated circuits

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Jochen A. G. Jess, K. Kalafala, Srinath R. Naidu,

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DAC 2003 | Design Automation | Parametric Yield Prediction |

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Added	13 Nov 2009
Updated	13 Nov 2009
Type	Conference
Year	2003
Where	DAC
Authors	Jochen A. G. Jess, K. Kalafala, Srinath R. Naidu, Ralph H. J. M. Otten, Chandramouli Visweswariah

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