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    1993
    IEEE
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    Structure and Metrology for an Analog Testability Bus

    14 years 3 months ago
    Structure and Metrology for an Analog Testability Bus
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    Kenneth P. Parker, John E. McDermid, Stig Oresjo
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    Added 08 Aug 2010
    Updated 08 Aug 2010
    Type Conference
    Year 1993
    Where ITC
    Authors Kenneth P. Parker, John E. McDermid, Stig Oresjo
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