System issues in boundary-scan board test

Boards have evolved into complex systems and even collections of interacting systems. Test engineers struggle to find out how these systems are initialized and booted because of poor documentation. While Boundary-Scan (IEEE Std 1149.1) [IEEE93, Park98] is a powerful test tool, test engineers are finding out that yesterday's DFT rules and test approaches may actually be detrimental to successfully testing systems on a board. One culprit is the boot up process of the board and even individual ICs. What can be done to address this?

• Type: Conference
• Year: 2000
• Where: ITC
• Authors: Kenneth P. Parker
• Keywords: Hardware, ITC 2000, Powerful Test Tool, Test Engineers, Yesterday's Dft Rules