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    ICCD
    1995
    IEEE
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    Testability analysis and insertion for RTL circuits based on pseudorandom BIST

    14 years 4 months ago
    Testability analysis and insertion for RTL circuits based on pseudorandom BIST
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    Joan Carletta, Christos A. Papachristou
    claim paper
    Added 26 Aug 2010
    Updated 26 Aug 2010
    Type Conference
    Year 1995
    Where ICCD
    Authors Joan Carletta, Christos A. Papachristou
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