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Testability analysis and insertion for RTL circuits based on...
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ICCD
1995
IEEE
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ICCD 1995
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Testability analysis and insertion for RTL circuits based on pseudorandom BIST
14 years 2 months ago
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Joan Carletta, Christos A. Papachristou
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DATE
1999
IEEE
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DATE 1999
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Efficient BIST Hardware Insertion with Low Test Application Time for Synthesized Data Paths
14 years 3 months ago
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In this paper, new and efficient BIST methodology and BIST hardware insertion algorithms are presented for RTL data paths obtained from high level synthesis. The methodology is ba...
Nicola Nicolici, Bashir M. Al-Hashimi
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