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DATE
2007
IEEE

Testing in the year 2020

14 years 5 months ago
Testing in the year 2020
Testing today of a several hundred million transistor System-on-Chip with analog, RF blocks, many processor cores and tens of memories is a huge task. What will test technology be like in year 2020 with hundreds of billions of transistors on a single chip? Can we get there with tweaks to today’s technology? While the exact nature of the circuit styles, architectural innovations and product innovations in year 2020 are highly speculative at this point, we examine the impact of likely design and process technology trends on testing methods.
Rajesh Galivanche, Rohit Kapur, Antonio Rubio
Added 02 Jun 2010
Updated 02 Jun 2010
Type Conference
Year 2007
Where DATE
Authors Rajesh Galivanche, Rohit Kapur, Antonio Rubio
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