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    A tool for measuring quality of test pattern for LSIs' functional design

    14 years 4 months ago
    A tool for measuring quality of test pattern for LSIs' functional design
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    Takashi Aoki, Tomoji Toriyama, Kenji Ishikawa, Ken
    claim paper
    Added 25 Aug 2010
    Updated 25 Aug 2010
    Type Conference
    Year 1995
    Where ASPDAC
    Authors Takashi Aoki, Tomoji Toriyama, Kenji Ishikawa, Kennosuke Fukami
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