Understanding the impact of power loss on flash memory

Flash memory is quickly becoming a common component in computer systems ranging from music players to mission-critical server systems. As flash plays a more important role, data integrity in flash memories becomes a critical question. This paper examines one aspect of that data integrity by measuring the types of errors that occur when power fails during a flash memory operation. Our findings demonstrate that power failure can lead to several nonintuitive behaviors. We find that increasing the time before power failure does not always reduce error rates and that a power failure during a program operation can corrupt data that a previous, successful program operation wrote to the device. Our data also show that interrupted program operations leave data more susceptible to read disturb and increase the probability that the programmed data will decay over time. Finally, we show that incomplete erase operations make future program operations to the same block unreliable. Categories a...

• Type: Journal
• Year: 2011
• Where: DAC
• Authors: Hung-Wei Tseng, Laura M. Grupp, Steven Swanson
• Keywords: Ash Memory, Computer Architecture, DAC 2011, Measurement Performance, Memory Operation