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GLVLSI
1998
IEEE

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VHDL Testability Analysis Based on Fault Clustering and Implicit Fault Injection

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VHDL Testability Analysis Based on Fault Clustering and Implicit Fault Injection

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F. S. Bietti, Fabrizio Ferrandi, Franco Fummi, Don

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Added	04 Aug 2010
Updated	04 Aug 2010
Type	Conference
Year	1998
Where	GLVLSI
Authors	F. S. Bietti, Fabrizio Ferrandi, Franco Fummi, Donatella Sciuto

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