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ICSE
2010
IEEE-ACM
13 years 9 months ago
An exploratory study of fault-proneness in evolving aspect-oriented programs
This paper presents the results of an exploratory study on the fault-proneness of aspect-oriented programs. We analysed the faults collected from three evolving aspect-oriented sy...
Fabiano Cutigi Ferrari, Rachel Burrows, Otá...
CASES
2007
ACM
13 years 11 months ago
SCCP/x: a compilation profile to support testing and verification of optimized code
Embedded systems are often used in safety-critical environments. Thus, thorough testing of them is mandatory. A quite active research area is the automatic test-case generation fo...
Raimund Kirner
ICSE
1999
IEEE-ACM
13 years 11 months ago
A Practical Method for Verifying Event-Driven Software
Formal verification methods are used only sparingly in software development. The most successful methods to date are based on the use of model checking tools. To use such he user ...
Gerard J. Holzmann, Margaret H. Smith
DAC
2007
ACM
14 years 8 months ago
Transition Delay Fault Test Pattern Generation Considering Supply Voltage Noise in a SOC Design
Due to shrinking technology, increasing functional frequency and density, and reduced noise margins with supply voltage scaling, the sensitivity of designs to supply voltage noise...
Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram
SIES
2010
IEEE
13 years 5 months ago
Verification of a CAN bus model in SystemC with functional coverage
Abstract--Many heterogeneous embedded systems, for example industrial automation and automotive applications, require hard-real time constraints to be exhaustively verified - which...
Christoph Kuznik, Gilles B. Defo, Wolfgang Mü...