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DSN
2004
IEEE
14 years 2 months ago
2004
IEEE
Advanced molecular nanotechnology devices are expected to have exceedingly high transient fault rates and large numbers of inherent device defects compared to conventional CMOS de...
BMCBI
2006
13 years 11 months ago
2006
Background: Accurate methods for extraction of meaningful patterns in high dimensional data have become increasingly important with the recent generation of data types containing ...