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TCAD
2008
88views more  TCAD 2008»
13 years 7 months ago
Self-Adaptive Data Caches for Soft-Error Reliability
Soft-error induced reliability problems have become a major challenge in designing new generation microprocessors. Due to the on-chip caches' dominant share in die area and tr...
Shuai Wang, Jie S. Hu, Sotirios G. Ziavras
DATE
2009
IEEE
148views Hardware» more  DATE 2009»
14 years 2 months ago
Visual quality analysis for dynamic backlight scaling in LCD systems
—With the trend toward high-quality large form factor displays on high-end handhelds, LCD backlight accounts for a significant and increasing percentage of the total energy budg...
Andrea Bartolini, Martino Ruggiero, Luca Benini
GECCO
2009
Springer
193views Optimization» more  GECCO 2009»
14 years 10 days ago
Optimization of dynamic memory managers for embedded systems using grammatical evolution
New portable consumer embedded devices must execute multimedia applications (e.g., 3D games, video players and signal processing software, etc.) that demand extensive memory acces...
José L. Risco-Martín, David Atienza,...
ISLPED
2006
ACM
145views Hardware» more  ISLPED 2006»
14 years 1 months ago
An optimal analytical solution for processor speed control with thermal constraints
As semiconductor manufacturing technology scales to smaller device sizes, the power consumption of clocked digital ICs begins to increase. Dynamic voltage and frequency scaling (D...
Ravishankar Rao, Sarma B. K. Vrudhula, Chaitali Ch...
ASPLOS
2012
ACM
12 years 3 months ago
Comprehensive kernel instrumentation via dynamic binary translation
Dynamic binary translation (DBT) is a powerful technique that enables fine-grained monitoring and manipulation of an existing program binary. At the user level, it has been emplo...
Peter Feiner, Angela Demke Brown, Ashvin Goel