103 search results - page 14 / 21 » A Fault Modeling Technique to Test Memory BIST Algorithms |
SAC
2008
ACM
13 years 7 months ago
2008
ACM
Model-based testing as a black-box testing technique has grown in importance. The models used represent the relevant features of the system under consideration (SUC), and can also...
EVOW
2001
Springer
14 years 8 days ago
2001
Springer
The integrated circuits design flow is rapidly moving towards higher description levels. However, test-related activities are lacking behind this trend, mainly since effective faul...
SIGSOFT
2008
ACM
14 years 8 months ago
2008
ACM
Many testing and analysis techniques have been developed for inhouse use. Although they are effective at discovering defects before a program is deployed, these techniques are oft...
ECAI
2004
Springer
14 years 1 months ago
2004
Springer
Recent years have seen considerable developments in modeling techniques for automatic fault location in programs. However, much of this research considered the models from a standa...
TSE
2010
13 years 2 months ago
2010
Genetic algorithms (GAs) have been applied previously to UML-driven, stress test requirements generation with the aim of increasing chances of discovering faults relating to networ...